Nucleus[1] Binding energy (MeV) g.s. Radius[3] & Deformation[4]
3014Si16   Silicon
J(π)=0+
T1/2=stable
Abundance: 3.092% 11
  Experiment
[2]		 Theory
[4]		 Sh.corr.
[4]
Mass Excess -24.432961
(0.000022)		 -22.900 3.140
BE 255.620 254.087
BE/A 8.521 8.470
<R2ch>1/2 = 3.1336 ± 0.004 fm [3]
Charge-density Distribution [6]

β2= -0.236
β3= 0.000
β4= 0.040
β6= -0.034
Excited States[1]
click on a plot to process it 		Known and possible Decays[1] Q-values (keV)
roman [2], italic [4]
α - decay-10643.32
β- - decay-4232.32
β+ - decay-9582.54
e-capture-8560.54
1p - decay-13517.30
2p - decay-23992.23
1n - decay-10609.18
2n - decay-19082.77
2β- - decay-10373.88
β-,n-15551.77
β-,2n-33427.79
β-,d-16075.83
β-,t-26998.34
β-,α-14647.71
β-,n,α-26012.96
EC,p-21119.17
EC,2p-38022.68
EC,α-19997.12
Metastable states and Resonances[1] Radiation energies (keV)[1] Thermal neutrons[1] El.-Magn. properties[5,7,8]
 
  
σ (b)
Capture 0.11
Scattering 2.49
 
μ (nm) Q (b) E* (keV)
+0.8(2)2235
-0.05(6)2235
B(E2)↑ = 0.02081 ( 64) e2b2,    β 0  = 0.3105 (48)
2

B(E3)↑ = 0.0023 ( 8) e2b3,    β 0  = 0.277 (0)
3

  
[1] National Nuclear Data Center, Evaluated Nuclear Structure Data File, https://www.nndc.bnl.gov/ensdf/.
[2] M. Wang, G. Audi, A.H. Wapstra, F.G. Kondev, M. MacCormick, X. Xu, and B. Pfeiffer, Chinese Physics C, 2012, vol. 36, pp. 1603-2014.
[3] I. Angeli, K.P. Marinova, Atomic Data and Nuclear Data Tables, 2013, vol. 99, pp. 69-95; unpublished update, 2016.
[4] P. Möller, A.J. Sierk, T. Ichikawa, H. Sagawa, Atomic Data and Nuclear Data Tables, 2016, vol. 109-110, pp. 1-204.
[5] N.J. Stone, https://www-nds.iaea.org/publications/indc/indc-nds-0658/; Atomic Data and Nuclear Data Tables, 2016, vol. 111-112, pp. 1–28.
[6] H. de Vries, C.W. de Jager, C. de Vries, Atomic Data and Nuclear Data Tables, 1987, vol. 36, pp. 495-536.
[7] B. Pritychenko, M. Birch, B. Singh, M. Horoi, Atomic Data and Nuclear Data Tables, 2016, vol. 107, pp. 1–139; 2017, vol. 114, pp. 371–374.
[8] T. Kibedi and R.H. Spear, Atomic Data and Nuclear Data Tables, 2002, vol. 80, pp. 35-82.